APA

You S., Lee D. H., Nguyen M. C., Jeon Y. S., Tong D., Bang H. J., Jeong J. K. & Choi R. (20160208). Effects of La Incorporation in Hf Based Dielectric on Leakage Conduction and Carrier Scattering Mechanisms. : Journal of nanoscience and nanotechnology.

Chicago

You Seung-Won, Lee Dong Hwi, Nguyen Manh Cuong, Jeon Yoon Seok, Tong Duc-Tai, Bang Hyun Joon, Jeong Jae Kyoung and Choi Rino. 20160208. Effects of La Incorporation in Hf Based Dielectric on Leakage Conduction and Carrier Scattering Mechanisms. : Journal of nanoscience and nanotechnology.

Harvard

You S., Lee D. H., Nguyen M. C., Jeon Y. S., Tong D., Bang H. J., Jeong J. K. and Choi R. (20160208). Effects of La Incorporation in Hf Based Dielectric on Leakage Conduction and Carrier Scattering Mechanisms. : Journal of nanoscience and nanotechnology.

MLA

You Seung-Won, Lee Dong Hwi, Nguyen Manh Cuong, Jeon Yoon Seok, Tong Duc-Tai, Bang Hyun Joon, Jeong Jae Kyoung and Choi Rino. Effects of La Incorporation in Hf Based Dielectric on Leakage Conduction and Carrier Scattering Mechanisms. : Journal of nanoscience and nanotechnology. 20160208.