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	1.	Convergent-beam electron diffraction. [electronic resource] by Tanaka, Michiyoshi Tsuda, Kenji Producer: 20111209 In: Journal of electron microscopy vol. 60 Suppl 1 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Simulations of Kikuchi patterns due to thermal diffuse scattering on MgO crystals. [electronic resource] by Omoto, Kazuya Tsuda, Kenji Tanaka, Michiyoshi Producer: 20020701 In: Journal of electron microscopy vol. 51 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction. [electronic resource] by Ogata, Yoichiro Tsuda, Kenji Tanaka, Michiyoshi Producer: 20081010 In: Acta crystallographica. Section A, Foundations of crystallography vol. 64 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Refinement of the crystal structural parameters of the intermediate phase of h-BaTiO3 using convergent-beam electron diffraction. [electronic resource] by Ogata, Yoichiro Tsuda, Kenji Akishige, Yukikuni Tanaka, Michiyoshi Producer: 20050222 In: Acta crystallographica. Section A, Foundations of crystallography vol. 60 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Lattice parameter determination of a composition controlled Si1-x Gex layer on a Si (001) substrate using convergent-beam electron diffraction. [electronic resource] by Akaogi, Takayuki Tsuda, Kenji Terauchi, Masami Tanaka, Michiyoshi Producer: 20050303 In: Journal of electron microscopy vol. 53 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED. [electronic resource] by Akaogi, Takayuki Tsuda, Kenji Terauchi, Masami Tanaka, Michiyoshi Producer: 20040505 In: Journal of electron microscopy vol. 53 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1102) substrate using convergent-beam electron diffraction. [electronic resource] by Akaogi, Takayuki Tsuda, Kenji Terauchi, Masami Tanaka, Michiyoshi Producer: 20061106 In: Journal of electron microscopy vol. 55 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction--the rhombohedral phase of LaCrO3. [electronic resource] by Tsuda, Kenji Ogata, Yoichiro Takagi, Kazunari Hashimoto, Takuya Tanaka, Michiyoshi Producer: 20021223 In: Acta crystallographica. Section A, Foundations of crystallography vol. 58 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)