Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1102) substrate using convergent-beam electron diffraction. [electronic resource]

By: Contributor(s): Producer: 20061106Description: 129-35 p. digitalISSN:
  • 0022-0744
Online resources: In: Journal of electron microscopy vol. 55
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Publication Type: Journal Article

There are no comments on this title.

to post a comment.