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	1.	Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues. [electronic resource] by Clifford, Charles A Seah, Martin P Producer: 20120731 In: Nanotechnology vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios. [electronic resource] by Clifford, Charles A Seah, Martin P Producer: 20090623 In: Nanotechnology vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry. [electronic resource] by Seah, Martin P Havelund, Rasmus Gilmore, Ian S Producer: 20180718 In: Journal of the American Society for Mass Spectrometry vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	G-SIMS: relative effectiveness of different monatomic primary ion source combinations. [electronic resource] by Seah, Martin P Gilmore, Ian S Green, Felicia M Producer: 20090416 In: Rapid communications in mass spectrometry : RCM vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions. [electronic resource] by Seah, Martin P Spencer, Steve J Shard, Alex G Producer: 20141104 In: The journal of physical chemistry. B vol. 117 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces? [electronic resource] by Green, Felicia M Gilmore, Ian S Seah, Martin P Producer: 20090219 In: Rapid communications in mass spectrometry : RCM vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Relationships between cluster secondary ion mass intensities generated by different cluster primary ions. [electronic resource] by Seah, Martin P Green, Felicia M Gilmore, Ian S Producer: 20100524 In: Journal of the American Society for Mass Spectrometry vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Nanomechanical measurements of hair as an example of micro-fibre analysis using atomic force microscopy nanoindentation. [electronic resource] by Clifford, Charles A Sano, Naoko Doyle, Peter Seah, Martin P Producer: 20120717 In: Ultramicroscopy vol. 114 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics. [electronic resource] by Havelund, Rasmus Seah, Martin P Shard, Alexander G Gilmore, Ian S Producer: 20150519 In: Journal of the American Society for Mass Spectrometry vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram. [electronic resource] by Aoyagi, Satoka Gilmore, Ian S Mihara, Ichiro Seah, Martin P Fletcher, Ian W Producer: 20130415 In: Rapid communications in mass spectrometry : RCM vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Imaging G-SIMS: a novel bismuth-manganese source emitter. [electronic resource] by Green, Felicia M Kollmer, Felix Niehuis, Ewald Gilmore, Ian S Seah, Martin P Producer: 20080911 In: Rapid communications in mass spectrometry : RCM vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Topography and field effects in secondary ion mass spectrometry--part I: conducting samples. [electronic resource] by Lee, Joanna L S Gilmore, Ian S Seah, Martin P Fletcher, Ian W Producer: 20111215 In: Journal of the American Society for Mass Spectrometry vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS. [electronic resource] by Shard, Alexander G Green, Felicia M Brewer, Paul J Seah, Martin P Gilmore, Ian S Producer: 20080424 In: The journal of physical chemistry. B vol. 112 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancy. [electronic resource] by Gurdak, Elzbieta Green, Felicia M Rakowska, Paulina D Seah, Martin P Salter, Tara L Gilmore, Ian S Producer: 20150521 In: Analytical chemistry vol. 86 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. [electronic resource] by Tiddia, Mariavitalia Mihara, Ichiro Seah, Martin P Trindade, Gustavo Ferraz Kollmer, Felix Roberts, Clive J Hague, Richard Mula, Guido Gilmore, Ian S Havelund, Rasmus Producer: 20190205 In: ACS applied materials & interfaces vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources. [electronic resource] by Yokoyama, Yuta Aoyagi, Satoka Fujii, Makiko Matsuo, Jiro Fletcher, John S Lockyer, Nicholas P Vickerman, John C Passarelli, Melissa K Havelund, Rasmus Seah, Martin P Producer: 20161213 In: Analytical chemistry vol. 88 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study. [electronic resource] by Shard, Alexander G Havelund, Rasmus Seah, Martin P Spencer, Steve J Gilmore, Ian S Winograd, Nicholas Mao, Dan Miyayama, Takuya Niehuis, Ewald Rading, Derk Moellers, Rudolf Producer: 20130304 In: Analytical chemistry vol. 84 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample. [electronic resource] by Vorng, Jean-Luc Kotowska, Anna M Passarelli, Melissa K West, Andrew Marshall, Peter S Havelund, Rasmus Seah, Martin P Dollery, Colin T Rakowska, Paulina D Gilmore, Ian S Producer: 20180817 In: Analytical chemistry vol. 88 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)