APA

Shard A. G., Havelund R., Seah M. P., Spencer S. J., Gilmore I. S., Winograd N., Mao D., Miyayama T., Niehuis E., Rading D. & Moellers R. (20130304). Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study. : Analytical chemistry.

Chicago

Shard Alexander G, Havelund Rasmus, Seah Martin P, Spencer Steve J, Gilmore Ian S, Winograd Nicholas, Mao Dan, Miyayama Takuya, Niehuis Ewald, Rading Derk and Moellers Rudolf. 20130304. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study. : Analytical chemistry.

Harvard

Shard A. G., Havelund R., Seah M. P., Spencer S. J., Gilmore I. S., Winograd N., Mao D., Miyayama T., Niehuis E., Rading D. and Moellers R. (20130304). Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study. : Analytical chemistry.

MLA

Shard Alexander G, Havelund Rasmus, Seah Martin P, Spencer Steve J, Gilmore Ian S, Winograd Nicholas, Mao Dan, Miyayama Takuya, Niehuis Ewald, Rading Derk and Moellers Rudolf. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study. : Analytical chemistry. 20130304.