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Results of search for 'au:"Ryu, Ju Tae"'
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Jang, Sung Hwan
Jung, Hyun Soo
Kim, Dong Hun
Kim, T W
Kim, Tae Whan
Ryu, Ju Tae
Woo, Myung Hun
Yoo, Keon-Ho
You, Joo Hyung
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Your search returned 6 results.
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1.
Degradation mechanisms of the program characteristics of 10 nm NAND flash memories due to cell-to-cell interference.
[electronic resource]
by
Ryu, Ju Tae
Kim, Tae Whan
Producer:
20140108
In:
Journal of nanoscience and nanotechnology
vol. 13
Online resources:
Available from publisher's website
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2.
Effect of the fixed charge distribution on the mobility degradation of the high-k dielectric MOSFETs.
[electronic resource]
by
Woo, Myung Hun
Ryu, Ju Tae
Kim, Tae Whan
Producer:
20150529
In:
Journal of nanoscience and nanotechnology
vol. 14
Availability:
No items available.
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3.
Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer.
[electronic resource]
by
Jung, Hyun Soo
Ryu, Ju Tae
Kim, Dong Hun
Kim, Tae Whan
Producer:
20150529
In:
Journal of nanoscience and nanotechnology
vol. 14
Online resources:
Available from publisher's website
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No items available.
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4.
Electrical characteristics of nanoscale NAND silicon-oxide-nitride-oxide-silicon flash memory devices fabricated on SOI substrates.
[electronic resource]
by
Ryu, Ju Tae
You, Joo Hyung
Yoo, Keon-Ho
Kim, Tae Whan
Producer:
20111219
In:
Journal of nanoscience and nanotechnology
vol. 11
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5.
Improvement of Resistive Random Access Memory Device Performance via Embedding of Low-K Dielectric Layer.
[electronic resource]
by
Jang, Sung Hwan
Ryu, Ju Tae
Jung, Hyun Soo
Kim, Tae Whan
Producer:
20160808
In:
Journal of nanoscience and nanotechnology
vol. 16
Online resources:
Available from publisher's website
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6.
Reliability Degeneration Mechanisms of the 20-nm Flash Memories Due to the Word Line Stress.
[electronic resource]
by
Jung, Hyun Soo
Ryu, Ju Tae
Yoo, Keon-Ho
Kim, T W
Producer:
20160808
In:
Journal of nanoscience and nanotechnology
vol. 16
Online resources:
Available from publisher's website
Availability:
No items available.
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