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Results of search for 'au:"Khursheed, Anjam"'
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Ang, Wei Kean
Bah, Andrew
Han, Weiding
Hoang, Hung Quang
Khursheed, Anjam
Lim, Kim Yong
Osterberg, Mans
Shao, Xiuyuan
Sow, Chorng Haur
Srinivasan, Avinash
Wei, Fuhua
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1.
Design of a focused electron beam column for ring-cathode sources.
[electronic resource]
by
Khursheed, Anjam
Producer:
20131025
In:
Ultramicroscopy
vol. 128
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2.
A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopes.
[electronic resource]
by
Khursheed, Anjam
Producer:
20050728
In:
Ultramicroscopy
vol. 103
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3.
Aberration characteristics of immersion lenses for LVSEM.
[electronic resource]
by
Khursheed, Anjam
Producer:
20030131
In:
Ultramicroscopy
vol. 93
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4.
A spectroscopic scanning electron microscope design.
[electronic resource]
by
Khursheed, Anjam
Osterberg, Mans
Producer:
20050112
In:
Scanning
vol. 26
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5.
Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer.
[electronic resource]
by
Srinivasan, Avinash
Khursheed, Anjam
Producer:
20150522
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 20
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6.
Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron Microscope.
[electronic resource]
by
Srinivasan, Avinash
Khursheed, Anjam
Producer:
20151104
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 21
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7.
Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe Current.
[electronic resource]
by
Khursheed, Anjam
Ang, Wei Kean
Producer:
20180719
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 22
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8.
A second-order focusing electrostatic toroidal electron spectrometer with 2pi radian collection.
[electronic resource]
by
Khursheed, Anjam
Hoang, Hung Quang
Producer:
20090210
In:
Ultramicroscopy
vol. 109
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9.
Redesign of the scanning electron microscope for parallel energy spectral acquisition.
[electronic resource]
by
Khursheed, Anjam
Hoang, Hung Quang
Producer:
20080411
In:
Ultramicroscopy
vol. 108
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10.
Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures.
[electronic resource]
by
Srinivasan, Avinash
Han, Weiding
Khursheed, Anjam
Producer:
20181211
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 24
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11.
Initial experimental results on a magnetic beam separator spectrometer for the SEM.
[electronic resource]
by
Osterberg, Mans
Hoang, Hung Quang
Khursheed, Anjam
Producer:
20091027
In:
Ultramicroscopy
vol. 109
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12.
A high-brightness large-diameter graphene coated point cathode field emission electron source.
[electronic resource]
by
Shao, Xiuyuan
Srinivasan, Avinash
Ang, Wei Kean
Khursheed, Anjam
Producer:
20181120
In:
Nature communications
vol. 9
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13.
Fluorescence Invigoration in Carbon-Incorporated Zinc Oxide Nanowires from Passage of Field Emission Electrons.
[electronic resource]
by
Bah, Andrew
Lim, Kim Yong
Wei, Fuhua
Khursheed, Anjam
Sow, Chorng Haur
Publication details:
Scientific reports
Jul 2019
In:
Scientific reports
vol. 9
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