APA

Srinivasan A., Han W. & Khursheed A. (20181211). Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Srinivasan Avinash, Han Weiding and Khursheed Anjam. 20181211. Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Srinivasan A., Han W. and Khursheed A. (20181211). Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Srinivasan Avinash, Han Weiding and Khursheed Anjam. Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20181211.