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	1.	The effect of large solid angles of collection on quantitative X-ray microanalysis in the AEM. [electronic resource] by Watanabe, M Ackland, D W Williams, D B Producer: 19990826 In: Journal of microscopy vol. 195 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction. [electronic resource] by Watanabe, M Ackland, D W Burrows, A Kiely, C J Williams, D B Krivanek, O L Dellby, N Murfitt, M F Szilagyi, Z Producer: 20091201 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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