Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction. [electronic resource]

By: Contributor(s): Producer: 20091201Description: 515-26 p. digitalISSN:
  • 1431-9276
Online resources: In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

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