Scanning electron microscopy (s.e.m.) of biopsy specimens of ruptured intracranial saccular aneurysms. [electronic resource]

By: Contributor(s): Producer: 19790124Description: 131-4 p. digitalISSN:
  • 0001-6322
Subject(s): Online resources: In: Acta neuropathologica vol. 44
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Publication Type: Journal Article

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