Scanning electron microscopy (s.e.m.) of biopsy specimens of ruptured intracranial saccular aneurysms.

Scanarini, M

Scanning electron microscopy (s.e.m.) of biopsy specimens of ruptured intracranial saccular aneurysms. [electronic resource] - Acta neuropathologica Nov 1978 - 131-4 p. digital

Publication Type: Journal Article

0001-6322

10.1007/BF00691478 doi


Adult
Biopsy
Cerebral Arteries--ultrastructure
Endothelium--ultrastructure
Humans
Intracranial Aneurysm--pathology
Male
Microscopy, Electron, Scanning
Middle Aged
Rupture, Spontaneous