Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation. [electronic resource]

By: Contributor(s): Publication details: Nano letters Feb 2020Description: 852-859 p. digitalISSN:
  • 1530-6992
Online resources: In: Nano letters vol. 20
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Publication Type: Journal Article

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