Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation.
Hunter, Katharine I
Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation. [electronic resource] - Nano letters Feb 2020 - 852-859 p. digital
Publication Type: Journal Article
1530-6992
10.1021/acs.nanolett.9b03025 doi
Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation. [electronic resource] - Nano letters Feb 2020 - 852-859 p. digital
Publication Type: Journal Article
1530-6992
10.1021/acs.nanolett.9b03025 doi