APA

Chen Z., Luo J., Doudevski I., Erten S. & Kim S. H. (102019). Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Chen Zhe, Luo Jiawei, Doudevski Ivo, Erten Sema and Kim Seong H. 102019. Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Chen Z., Luo J., Doudevski I., Erten S. and Kim S. H. (102019). Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Chen Zhe, Luo Jiawei, Doudevski Ivo, Erten Sema and Kim Seong H. Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 102019.