Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. (Record no. 29903125)

MARC details
000 -LEADER
fixed length control field 01101 a2200229 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250518051112.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field ####s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1435-8115
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1017/S1431927619014697
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Chen, Zhe
245 00 - TITLE STATEMENT
Title Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Date of publication, distribution, etc. 10 2019
300 ## - PHYSICAL DESCRIPTION
Extent 1106-1111 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Luo, Jiawei
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Doudevski, Ivo
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Erten, Sema
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Kim, Seong H
773 0# - HOST ITEM ENTRY
Title Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Related parts vol. 25
-- no. 5
-- p. 1106-1111
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1017/S1431927619014697">https://doi.org/10.1017/S1431927619014697</a>
Public note Available from publisher's website

No items available.