APA

Song H., Kim S., Lim D., Kwon S., Choi C., Lee G. & Lee H. (2019). Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. : Journal of nanoscience and nanotechnology.

Chicago

Song Hyeong-Sub, Kim So-Yeong, Lim Dong-Hwan, Kwon Sung-Kyu, Choi Chang-Hwan, Lee Ga-Won and Lee Hi-Deok. 2019. Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. : Journal of nanoscience and nanotechnology.

Harvard

Song H., Kim S., Lim D., Kwon S., Choi C., Lee G. and Lee H. (2019). Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. : Journal of nanoscience and nanotechnology.

MLA

Song Hyeong-Sub, Kim So-Yeong, Lim Dong-Hwan, Kwon Sung-Kyu, Choi Chang-Hwan, Lee Ga-Won and Lee Hi-Deok. Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. : Journal of nanoscience and nanotechnology. 2019.