Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. (Record no. 29629659)
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fixed length control field | 01011 a2200253 4500 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20250518035000.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | ####s 0 0 eng d |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER | |
International Standard Serial Number | 1533-4880 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1166/jnn.2019.16992 |
Source of number or code | doi |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | NLM |
Language of cataloging | eng |
Transcribing agency | NLM |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Song, Hyeong-Sub |
245 00 - TITLE STATEMENT | |
Title | Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks. |
Medium | [electronic resource] |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Name of publisher, distributor, etc. | Journal of nanoscience and nanotechnology |
Date of publication, distribution, etc. | Oct 2019 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 6131-6134 p. |
Other physical details | digital |
500 ## - GENERAL NOTE | |
General note | Publication Type: Journal Article |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Kim, So-Yeong |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Lim, Dong-Hwan |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Kwon, Sung-Kyu |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Choi, Chang-Hwan |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Lee, Ga-Won |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Lee, Hi-Deok |
773 0# - HOST ITEM ENTRY | |
Title | Journal of nanoscience and nanotechnology |
Related parts | vol. 19 |
-- | no. 10 |
-- | p. 6131-6134 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="https://doi.org/10.1166/jnn.2019.16992">https://doi.org/10.1166/jnn.2019.16992</a> |
Public note | Available from publisher's website |
No items available.