Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces. [electronic resource]
Producer: 20180205Description: 194-203 p. digitalISSN:- 1948-7185
No physical items for this record
Publication Type: Journal Article
There are no comments on this title.
Log in to your account to post a comment.