Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces.
Pham, Tuan Anh
Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces. [electronic resource] - The journal of physical chemistry letters Jan 2018 - 194-203 p. digital
Publication Type: Journal Article
1948-7185
10.1021/acs.jpclett.7b01382 doi
Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces. [electronic resource] - The journal of physical chemistry letters Jan 2018 - 194-203 p. digital
Publication Type: Journal Article
1948-7185
10.1021/acs.jpclett.7b01382 doi