Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns. [electronic resource]

By: Contributor(s): Producer: 20170808Description: 25-36 p. digitalISSN:
  • 2156-8944
Subject(s): Online resources: In: ACS combinatorial science vol. 19
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Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

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