Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns.
Hernández-Rivera, Efraín
Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns. [electronic resource] - ACS combinatorial science 01 2017 - 25-36 p. digital
Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
2156-8944
10.1021/acscombsci.6b00142 doi
Cluster Analysis
High-Throughput Screening Assays--methods
Normal Distribution
Powder Diffraction--methods
X-Ray Diffraction--methods
Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns. [electronic resource] - ACS combinatorial science 01 2017 - 25-36 p. digital
Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
2156-8944
10.1021/acscombsci.6b00142 doi
Cluster Analysis
High-Throughput Screening Assays--methods
Normal Distribution
Powder Diffraction--methods
X-Ray Diffraction--methods