Analysis of Resistance and Surface Recombination Velocities by Contact Coverage for Optimizing Electrical Loss in c-Si Local Back Contact. [electronic resource]

By: Contributor(s): Producer: 20151001Description: 4398-402 p. digitalISSN:
  • 1533-4899
Online resources: In: Journal of nanoscience and nanotechnology vol. 15
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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