Analysis of Resistance and Surface Recombination Velocities by Contact Coverage for Optimizing Electrical Loss in c-Si Local Back Contact.

Park, Cheolmin

Analysis of Resistance and Surface Recombination Velocities by Contact Coverage for Optimizing Electrical Loss in c-Si Local Back Contact. [electronic resource] - Journal of nanoscience and nanotechnology Jun 2015 - 4398-402 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1533-4899

10.1166/jnn.2015.9793 doi