Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques. [electronic resource]

By: Contributor(s): Producer: 20140313Description: 16431-43 p. digitalISSN:
  • 1094-4087
Subject(s): Online resources: In: Optics express vol. 21
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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