Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques.

Bartl, D

Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques. [electronic resource] - Optics express Jul 2013 - 16431-43 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1094-4087

10.1364/OE.21.016431 doi


Conductometry--methods
Lasers
Materials Testing--methods
Membranes, Artificial
Molybdenum--analysis
Refractometry--methods