APA

Jepson M., Liu X., Bell D., Ferranti D., Inkson B. & Rodenburg C. (20111107). Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Jepson Mark, Liu Xiong, Bell David, Ferranti David, Inkson Beverley and Rodenburg Cornelia. 20111107. Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Jepson M., Liu X., Bell D., Ferranti D., Inkson B. and Rodenburg C. (20111107). Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Jepson Mark, Liu Xiong, Bell David, Ferranti David, Inkson Beverley and Rodenburg Cornelia. Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20111107.