APA

Gasser P., Klotz U. E., Khalid F. A. & Beffort O. (20040916). Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Gasser Philippe, Klotz Ulrich E, Khalid Fazal A and Beffort Olivier. 20040916. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Gasser P., Klotz U. E., Khalid F. A. and Beffort O. (20040916). Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Gasser Philippe, Klotz Ulrich E, Khalid Fazal A and Beffort Olivier. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20040916.