Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites.

Gasser, Philippe

Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Apr 2004 - 311-6 p. digital

Publication Type: Journal Article

1431-9276

10.1017/S1431927604040413 doi


Metals--chemistry
Microscopy, Electron--methods
Microscopy, Electron, Scanning--methods
Models, Molecular
Resins, Synthetic--chemistry