Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source. (Record no. 28691155)

MARC details
000 -LEADER
fixed length control field 00833 a2200229 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250517231622.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201808s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1089-7623
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1063/1.5025228
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Hamano, Akihide
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20180802
245 00 - TITLE STATEMENT
Title Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. The Review of scientific instruments
Date of publication, distribution, etc. Jul 2018
300 ## - PHYSICAL DESCRIPTION
Extent 073701 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ohno, Seigo
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Minamide, Hiroaki
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ito, Hiromasa
773 0# - HOST ITEM ENTRY
Title The Review of scientific instruments
Related parts vol. 89
-- no. 7
-- p. 073701
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1063/1.5025228">https://doi.org/10.1063/1.5025228</a>
Public note Available from publisher's website

No items available.