Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source.
Hamano, Akihide
Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source. [electronic resource] - The Review of scientific instruments Jul 2018 - 073701 p. digital
Publication Type: Journal Article
1089-7623
10.1063/1.5025228 doi
Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source. [electronic resource] - The Review of scientific instruments Jul 2018 - 073701 p. digital
Publication Type: Journal Article
1089-7623
10.1063/1.5025228 doi