Quantitative electrostatic force microscopy with sharp silicon tips. (Record no. 24364016)

MARC details
000 -LEADER
fixed length control field 00786 a2200217 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250517003017.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201503s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1361-6528
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1088/0957-4484/25/49/495701
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Fumagalli, L
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20150330
245 00 - TITLE STATEMENT
Title Quantitative electrostatic force microscopy with sharp silicon tips.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Nanotechnology
Date of publication, distribution, etc. Dec 2014
300 ## - PHYSICAL DESCRIPTION
Extent 495701 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Edwards, M A
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Gomila, G
773 0# - HOST ITEM ENTRY
Title Nanotechnology
Related parts vol. 25
-- no. 49
-- p. 495701
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1088/0957-4484/25/49/495701">https://doi.org/10.1088/0957-4484/25/49/495701</a>
Public note Available from publisher's website

No items available.