Quantitative electrostatic force microscopy with sharp silicon tips.
Fumagalli, L
Quantitative electrostatic force microscopy with sharp silicon tips. [electronic resource] - Nanotechnology Dec 2014 - 495701 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
1361-6528
10.1088/0957-4484/25/49/495701 doi
Quantitative electrostatic force microscopy with sharp silicon tips. [electronic resource] - Nanotechnology Dec 2014 - 495701 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
1361-6528
10.1088/0957-4484/25/49/495701 doi