Electronic structure analysis for group III acceptors in Ge under stress considering screening effect and central-cell correction. (Record no. 21073282)

MARC details
000 -LEADER
fixed length control field 00893 a2200205 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250516051624.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201210s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1361-648X
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1088/0953-8984/21/33/335801
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Wang, T H
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20121002
245 00 - TITLE STATEMENT
Title Electronic structure analysis for group III acceptors in Ge under stress considering screening effect and central-cell correction.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Journal of physics. Condensed matter : an Institute of Physics journal
Date of publication, distribution, etc. Aug 2009
300 ## - PHYSICAL DESCRIPTION
Extent 335801 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Yen, S T
773 0# - HOST ITEM ENTRY
Title Journal of physics. Condensed matter : an Institute of Physics journal
Related parts vol. 21
-- no. 33
-- p. 335801
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1088/0953-8984/21/33/335801">https://doi.org/10.1088/0953-8984/21/33/335801</a>
Public note Available from publisher's website

No items available.