Use of quantitative convergent-beam electron diffraction in materials science. (Record no. 10381521)

MARC details
000 -LEADER
fixed length control field 01171 a2200301 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250513190233.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 199909s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1059-910X
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Holmestad, R
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 19990922
245 00 - TITLE STATEMENT
Title Use of quantitative convergent-beam electron diffraction in materials science.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Microscopy research and technique
Date of publication, distribution, etc. Jul 1999
300 ## - PHYSICAL DESCRIPTION
Extent 130-45 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Alloys
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Materials Testing
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metals
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microscopy, Electron
General subdivision instrumentation
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Birkeland, C R
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Marthinsen, K
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Høier, R
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Zuo, J M
773 0# - HOST ITEM ENTRY
Title Microscopy research and technique
Related parts vol. 46
-- no. 2
-- p. 130-45
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O">https://doi.org/10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O</a>
Public note Available from publisher's website

No items available.