Use of quantitative convergent-beam electron diffraction in materials science.
Holmestad, R
Use of quantitative convergent-beam electron diffraction in materials science. [electronic resource] - Microscopy research and technique Jul 1999 - 130-45 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
1059-910X
10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O doi
Alloys
Materials Testing
Metals
Microscopy, Electron--instrumentation
Semiconductors
Use of quantitative convergent-beam electron diffraction in materials science. [electronic resource] - Microscopy research and technique Jul 1999 - 130-45 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
1059-910X
10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O doi
Alloys
Materials Testing
Metals
Microscopy, Electron--instrumentation
Semiconductors