Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials. [electronic resource]

By: Contributor(s): Publication details: ECS journal of solid state science and technology : JSS 2016Description: N61-N66 p. digitalISSN:
  • 2162-8769
Online resources: In: ECS journal of solid state science and technology : JSS vol. 5
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Publication Type: Journal Article

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