Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials.

Obeng, Yaw S

Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials. [electronic resource] - ECS journal of solid state science and technology : JSS 2016 - N61-N66 p. digital

Publication Type: Journal Article

2162-8769

10.1149/2.0411609jss doi