| 000 | 00809 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250512172632.0 | ||
| 264 | 0 | _c19680629 | |
| 008 | 196806s 0 0 eng d | ||
| 022 | _a0950-7671 | ||
| 024 | 7 |
_a10.1088/0022-3735/1/2/412 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aReed, S J | |
| 245 | 0 | 0 |
_aProbe current stability in electron-probe microanalysis. _h[electronic resource] |
| 260 |
_bJournal of scientific instruments _cFeb 1968 |
||
| 300 |
_a136-9 p. _bdigital |
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| 500 | _aPublication Type: Journal Article | ||
| 650 | 0 | 4 | _aElectron Probe Microanalysis |
| 650 | 0 | 4 | _aElectrons |
| 650 | 0 | 4 | _aSpectrum Analysis |
| 773 | 0 |
_tJournal of scientific instruments _gvol. 1 _gno. 2 _gp. 136-9 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0022-3735/1/2/412 _zAvailable from publisher's website |
| 999 |
_c5648937 _d5648937 |
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