| 000 | 00944 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250512054040.0 | ||
| 264 | 0 | _c19870429 | |
| 008 | 198704s 0 0 eng d | ||
| 022 | _a0077-8923 | ||
| 024 | 7 |
_a10.1111/j.1749-6632.1986.tb34541.x _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aOttensmeyer, F P | |
| 245 | 0 | 0 |
_aElemental mapping by energy filtration: advantages, limitations, and compromises. _h[electronic resource] |
| 260 |
_bAnnals of the New York Academy of Sciences _c1986 |
||
| 300 |
_a339-53 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aElectron Probe Microanalysis _xmethods |
| 650 | 0 | 4 | _aElements |
| 650 | 0 | 4 | _aMathematics |
| 650 | 0 | 4 | _aScattering, Radiation |
| 773 | 0 |
_tAnnals of the New York Academy of Sciences _gvol. 483 _gp. 339-53 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1111/j.1749-6632.1986.tb34541.x _zAvailable from publisher's website |
| 999 |
_c3476861 _d3476861 |
||