| 000 | 00739 a2200193 4500 | ||
|---|---|---|---|
| 005 | 20250518085156.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a2079-4991 | ||
| 024 | 7 |
_a10.3390/nano10020332 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aSkoupy, Radim | |
| 245 | 0 | 0 |
_aNanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration. _h[electronic resource] |
| 260 |
_bNanomaterials (Basel, Switzerland) _cFeb 2020 |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aFort, Tomas | |
| 700 | 1 | _aKrzyzanek, Vladislav | |
| 773 | 0 |
_tNanomaterials (Basel, Switzerland) _gvol. 10 _gno. 2 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.3390/nano10020332 _zAvailable from publisher's website |
| 999 |
_c30651395 _d30651395 |
||