| 000 | 00816 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250518071325.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1879-2723 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2019.112881 _2doi |
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| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aChmielewski, A | |
| 245 | 0 | 0 |
_aNanoscale temperature measurement during temperature controlled in situ TEM using Al plasmon nanothermometry. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cFeb 2020 |
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| 300 |
_a112881 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aRicolleau, C | |
| 700 | 1 | _aAlloyeau, D | |
| 700 | 1 | _aWang, G | |
| 700 | 1 | _aNelayah, J | |
| 773 | 0 |
_tUltramicroscopy _gvol. 209 _gp. 112881 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2019.112881 _zAvailable from publisher's website |
| 999 |
_c30324748 _d30324748 |
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