| 000 | 01022 a2200289 4500 | ||
|---|---|---|---|
| 005 | 20250518061404.0 | ||
| 264 | 0 | _c20191003 | |
| 008 | 201910s 0 0 eng d | ||
| 022 | _a1944-8252 | ||
| 024 | 7 |
_a10.1021/acsami.9b08316 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLee, Hojin | |
| 245 | 0 | 0 |
_aPassivation of Deep-Level Defects by Cesium Fluoride Post-Deposition Treatment for Improved Device Performance of Cu(In,Ga)Se _h[electronic resource] |
| 260 |
_bACS applied materials & interfaces _cOct 2019 |
||
| 300 |
_a35653-35660 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aJang, Yuseong | |
| 700 | 1 | _aNam, Sung-Wook | |
| 700 | 1 | _aJung, Chanwon | |
| 700 | 1 | _aChoi, Pyuck-Pa | |
| 700 | 1 | _aGwak, Jihye | |
| 700 | 1 | _aYun, Jae Ho | |
| 700 | 1 | _aKim, Kihwan | |
| 700 | 1 | _aShin, Byungha | |
| 773 | 0 |
_tACS applied materials & interfaces _gvol. 11 _gno. 39 _gp. 35653-35660 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1021/acsami.9b08316 _zAvailable from publisher's website |
| 999 |
_c30116821 _d30116821 |
||