| 000 | 01101 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250518051112.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1435-8115 | ||
| 024 | 7 |
_a10.1017/S1431927619014697 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aChen, Zhe | |
| 245 | 0 | 0 |
_aAtomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. _h[electronic resource] |
| 260 |
_bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _c10 2019 |
||
| 300 |
_a1106-1111 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 700 | 1 | _aLuo, Jiawei | |
| 700 | 1 | _aDoudevski, Ivo | |
| 700 | 1 | _aErten, Sema | |
| 700 | 1 | _aKim, Seong H | |
| 773 | 0 |
_tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _gvol. 25 _gno. 5 _gp. 1106-1111 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1017/S1431927619014697 _zAvailable from publisher's website |
| 999 |
_c29903125 _d29903125 |
||