000 01334 a2200409 4500
005 20250518050129.0
264 0 _c20200217
008 202002s 0 0 eng d
022 _a1600-5775
024 7 _a10.1107/S1600577519003552
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLaksman, Joakim
245 0 0 _aCommissioning of a photoelectron spectrometer for soft X-ray photon diagnostics at the European XFEL.
_h[electronic resource]
260 _bJournal of synchrotron radiation
_cJul 2019
300 _a1010-1016 p.
_bdigital
500 _aPublication Type: Journal Article
650 0 4 _aEurope
650 0 4 _aPhotoelectron Spectroscopy
_xinstrumentation
650 0 4 _aPhotons
650 0 4 _aX-Rays
700 1 _aBuck, Jens
700 1 _aGlaser, Leif
700 1 _aPlanas, Marc
700 1 _aDietrich, Florian
700 1 _aLiu, Jia
700 1 _aMaltezopoulos, Theophilos
700 1 _aScholz, Frank
700 1 _aSeltmann, Jörn
700 1 _aHartmann, Gregor
700 1 _aIlchen, Markus
700 1 _aFreund, Wolfgang
700 1 _aKujala, Naresh
700 1 _aViefhaus, Jens
700 1 _aGrünert, Jan
773 0 _tJournal of synchrotron radiation
_gvol. 26
_gno. Pt 4
_gp. 1010-1016
856 4 0 _uhttps://doi.org/10.1107/S1600577519003552
_zAvailable from publisher's website
999 _c29870545
_d29870545