| 000 | 00827 a2200193 4500 | ||
|---|---|---|---|
| 005 | 20250518045039.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1879-2723 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2019.05.009 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aShin, Hyun Wook | |
| 245 | 0 | 0 |
_aA conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cOct 2019 |
||
| 300 |
_a57-61 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aSon, Jong Yeog | |
| 773 | 0 |
_tUltramicroscopy _gvol. 205 _gp. 57-61 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2019.05.009 _zAvailable from publisher's website |
| 999 |
_c29834956 _d29834956 |
||