000 | 00934 a2200217 4500 | ||
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005 | 20250518041617.0 | ||
008 | ####s 0 0 eng d | ||
022 | _a1948-7185 | ||
024 | 7 |
_a10.1021/acs.jpclett.9b01053 _2doi |
|
040 |
_aNLM _beng _cNLM |
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100 | 1 | _aHaeger, Tobias | |
245 | 0 | 0 |
_aSimultaneous Mapping of Thermal Conductivity, Thermal Diffusivity, and Volumetric Heat Capacity of Halide Perovskite Thin Films: A Novel Nanoscopic Thermal Measurement Technique. _h[electronic resource] |
260 |
_bThe journal of physical chemistry letters _cJun 2019 |
||
300 |
_a3019-3023 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aWilmes, Maximilian | |
700 | 1 | _aHeiderhoff, Ralf | |
700 | 1 | _aRiedl, Thomas | |
773 | 0 |
_tThe journal of physical chemistry letters _gvol. 10 _gno. 11 _gp. 3019-3023 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1021/acs.jpclett.9b01053 _zAvailable from publisher's website |
999 |
_c29718642 _d29718642 |