000 00934 a2200217 4500
005 20250518041617.0
008 ####s 0 0 eng d
022 _a1948-7185
024 7 _a10.1021/acs.jpclett.9b01053
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aHaeger, Tobias
245 0 0 _aSimultaneous Mapping of Thermal Conductivity, Thermal Diffusivity, and Volumetric Heat Capacity of Halide Perovskite Thin Films: A Novel Nanoscopic Thermal Measurement Technique.
_h[electronic resource]
260 _bThe journal of physical chemistry letters
_cJun 2019
300 _a3019-3023 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aWilmes, Maximilian
700 1 _aHeiderhoff, Ralf
700 1 _aRiedl, Thomas
773 0 _tThe journal of physical chemistry letters
_gvol. 10
_gno. 11
_gp. 3019-3023
856 4 0 _uhttps://doi.org/10.1021/acs.jpclett.9b01053
_zAvailable from publisher's website
999 _c29718642
_d29718642