000 01055 a2200229 4500
005 20250518041333.0
008 ####s 0 0 eng d
022 _a1435-8115
024 7 _a10.1017/S143192761900062X
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aArat, Kerim Tugrul
245 0 0 _aEstimating Step Heights from Top-Down SEM Images.
_h[electronic resource]
260 _bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_cAug 2019
300 _a903-911 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aBolten, Jens
700 1 _aZonnevylle, Aernout Christiaan
700 1 _aKruit, Pieter
700 1 _aHagen, Cornelis Wouter
773 0 _tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_gvol. 25
_gno. 4
_gp. 903-911
856 4 0 _uhttps://doi.org/10.1017/S143192761900062X
_zAvailable from publisher's website
999 _c29710527
_d29710527