000 01101 a2200325 4500
005 20250518035246.0
008 ####s 0 0 eng d
022 _a2045-2322
024 7 _a10.1038/s41598-019-43186-7
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aHong, Sae-Young
245 0 0 _aStudy on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors.
_h[electronic resource]
260 _bScientific reports
_cApr 2019
300 _a6588 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aKim, Hee-Joong
700 1 _aKim, Dae-Hwan
700 1 _aJeong, Ha-Yun
700 1 _aSong, Sang-Hun
700 1 _aCho, In-Tak
700 1 _aNoh, Jiyong
700 1 _aYun, Pil Sang
700 1 _aLee, Seok-Woo
700 1 _aPark, Kwon-Shik
700 1 _aYoon, SooYoung
700 1 _aKang, In Byeong
700 1 _aKwon, Hyuck-In
773 0 _tScientific reports
_gvol. 9
_gno. 1
_gp. 6588
856 4 0 _uhttps://doi.org/10.1038/s41598-019-43186-7
_zAvailable from publisher's website
999 _c29639451
_d29639451