| 000 | 00845 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250518030538.0 | ||
| 264 | 0 | _c20191024 | |
| 008 | 201910s 0 0 eng d | ||
| 022 | _a1878-4291 | ||
| 024 | 7 |
_a10.1016/j.micron.2019.02.006 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMelo, Lis G A | |
| 245 | 0 | 0 |
_aElectron beam damage of perfluorosulfonic acid studied by soft X-ray spectromicroscopy. _h[electronic resource] |
| 260 |
_bMicron (Oxford, England : 1993) _c06 2019 |
||
| 300 |
_a8-20 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 700 | 1 | _aHitchcock, Adam P | |
| 773 | 0 |
_tMicron (Oxford, England : 1993) _gvol. 121 _gp. 8-20 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.micron.2019.02.006 _zAvailable from publisher's website |
| 999 |
_c29481392 _d29481392 |
||